Bellamy SL, Sullivan LM

Gray TF, Revette AC, Nava-Coulter B, Gould K, Close S, Sullivan LM, Flynn KE, Katsetos KA, Cutler C, Ho VT, Hammer MJ, El-Jawahri A, Tulsky JA

Kumari P, Sullivan LM, Li Z, Parker Conquest E, Cornforth E, Jayakumar R, Hu N, Alexander Sizemore J, McKee BB, Kitchen RR, González-Pérez P, Linville C, Castro K, Gutierrez H, Samaan S, Townsend EL, Darras BT, Rutkove SB, Iannaccone ST, Clemens PR, Puwanant A, Das S, Wheeler TM

Sullivan LM, Cowan M, Gabert L, Lenzi T

Kelkar AH, Kerssens C, Groblewski N, Clancy D, Close SD, Sullivan LM, Sherman-Manhard D, Cutler C, Wang V, Abel GA

Sullivan LM, Weist EM, Barrington WE, Fairchild AL, Hwang W, Kiviniemi MT, Mohammed SD, Wyant VA, Alexander LA, Magaña L

Sullivan LM, Creveling S, Cowan M, Gabert L, Lenzi T, Member, IEEE

Creveling S, Cowan M, Sullivan LM, Gabert L, Lenzi T

Cowan M, Creveling S, Sullivan LM, Gabert L, Lenzi T

Sullivan LM, Velez AA, Longe N, Larese AM, Galea S